Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope
نویسندگان
چکیده
منابع مشابه
Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
The use of spherical aberration correctors in the scanning transmission electron microscope (STEM) has the effect of reducing the depth of field of the microscope, making three-dimensional imaging of a specimen possible by optical sectioning. Depth resolution can be improved further by placing aberration correctors and lenses pre and post specimen to achieve an imaging mode known as scanning co...
متن کاملThree-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
The depth resolution for optical sectioning in the scanning transmission electron microscope is measured using the results of optical sectioning experiments of laterally extended objects. We show that the depth resolution depends on the numerical aperture of the objective lens as expected. We also find, however, that the depth resolution depends on the lateral extent of the object that is being...
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Due to the refined nature of microstructures that can be effectively manipulated by the application of various thermal/mechanical processes, metastable beta titanium alloys have attracted considerable attention in recent days. Usually, such refinement involves the precipitation of the intragranular hcp structure alpha phase. In authors recent studies, it has been shown that the size, morphology...
متن کاملAberration-corrected scanning transmission electron microscopy of semiconductors
The scanning transmission electron microscope (STEM) has been able to image individual heavy atoms in a light matrix for some time. It is now able to do much more: it can resolve individual atoms as light as boron in monolayer materials; image atomic columns as light as hydrogen, identify the chemical type of individual isolated atoms from the intensity of their annular dark field (ADF) image a...
متن کاملResolving 45 pm with 300 kV Aberration Corrected STEM
Eternal challenge towards better resolution has been running by scientists who pursue to see smaller scale world, and countless efforts were spent since the microscope was invented. Within recent decades, Cs corrected microscope [1-3] realized sub-angstrom resolution [4,5]. And further resolution, sub-50-pm was demonstrated in dark-field STEM at 300 kV with an aberration corrected microscope us...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611007215